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Analysis, characterization and diagnosis of photovoltaic devices of any technology (from crystalline silicon wafer, a-Si, CIS, CdTe, III-V, OPV …) and different materials.


 Electrical, optical and structural materials assesment

  • Sheet resistance, thickness maps (up to 15cm x 15cm). Perfilometry, mechanical properties
  • Spectral ellipsometry, reflectance and transmittance (spectrally resolved).
  • Sinton, DLTS, PCD, LBIC.
  • SEM-EDX, AF


Photovoltaic cells diagnosis and characterization

  • I-V curve and power determination (as of IEC-60904).
  • Spectral response.
  • Lock-in thermography.
  • Electroluminiscenc

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