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Analysis, characterization and diagnosis of photovoltaic devices of any technology (from crystalline silicon wafer, a-Si, CIS, CdTe, III-V, OPV …) and different materials.
Electrical, optical and structural materials assesment
- Sheet resistance, thickness maps (up to 15cm x 15cm). Perfilometry, mechanical properties
- Spectral ellipsometry, reflectance and transmittance (spectrally resolved).
- Sinton, DLTS, PCD, LBIC.
- SEM-EDX, AF
Photovoltaic cells diagnosis and characterization
- I-V curve and power determination (as of IEC-60904).
- Spectral response.
- Lock-in thermography.